Kuo-Chan Huang, Chung-Len Lee, Jwu E. Chen. Maximization of power dissipation under random excitation for burn-in testing. In Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998. pages 567-576, IEEE Computer Society, 1998. [doi]
@inproceedings{HuangLC98,
title = {Maximization of power dissipation under random excitation for burn-in testing},
author = {Kuo-Chan Huang and Chung-Len Lee and Jwu E. Chen},
year = {1998},
url = {http://www.computer.org/proceedings/itc/5093/50930567abs.htm},
tags = {testing, e-science, random testing},
researchr = {https://researchr.org/publication/HuangLC98},
cites = {0},
citedby = {0},
pages = {567-576},
booktitle = {Proceedings IEEE International Test Conference 1998, Washington, DC, USA, October 18-22, 1998},
publisher = {IEEE Computer Society},
isbn = {0-7803-5093-6},
}