Thermal and electrical performance investigation of FinFET with encased air-gap gate sidewalls from spacer encapsulation layer material and structure parameter perspectives

Ning Huang, Weijing Liu, Qinghua Li, Wei Bai, Xiadong Tang, Ting Yang. Thermal and electrical performance investigation of FinFET with encased air-gap gate sidewalls from spacer encapsulation layer material and structure parameter perspectives. Microelectronics Journal, 103:104846, 2020. [doi]

Abstract

Abstract is missing.