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Methodology of generating dual-cell-aware tests

Yu-Hao Huang, Ching-Ho Lu, Tse-Wei Wu, Yu-Teng Nien, Ying-Yen Chen, Max Wu, Jih-Nung Lee, Mango C.-T. Chao. Methodology of generating dual-cell-aware tests. In 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017. pages 1-6, IEEE, 2017. [doi]

Authors

Yu-Hao Huang

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Ching-Ho Lu

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Tse-Wei Wu

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Yu-Teng Nien

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Ying-Yen Chen

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Max Wu

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Jih-Nung Lee

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Mango C.-T. Chao

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