Yu-Hao Huang, Ching-Ho Lu, Tse-Wei Wu, Yu-Teng Nien, Ying-Yen Chen, Max Wu, Jih-Nung Lee, Mango C.-T. Chao. Methodology of generating dual-cell-aware tests. In 35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017. pages 1-6, IEEE, 2017. [doi]
@inproceedings{HuangLWNCWLC17,
title = {Methodology of generating dual-cell-aware tests},
author = {Yu-Hao Huang and Ching-Ho Lu and Tse-Wei Wu and Yu-Teng Nien and Ying-Yen Chen and Max Wu and Jih-Nung Lee and Mango C.-T. Chao},
year = {2017},
doi = {10.1109/VTS.2017.7928925},
url = {https://doi.org/10.1109/VTS.2017.7928925},
researchr = {https://researchr.org/publication/HuangLWNCWLC17},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {35th IEEE VLSI Test Symposium, VTS 2017, Las Vegas, NV, USA, April 9-12, 2017},
publisher = {IEEE},
isbn = {978-1-5090-4482-5},
}