Parasitic Reflection Eliminating for Planar Elements Based on Multi-Frequency Phase-Shifting in Phase Measuring Deflectometry

Siya Huang, Yuankun Liu, Xin Yu. Parasitic Reflection Eliminating for Planar Elements Based on Multi-Frequency Phase-Shifting in Phase Measuring Deflectometry. Sensors, 24(4):1239, February 2024. [doi]

Authors

Siya Huang

This author has not been identified. Look up 'Siya Huang' in Google

Yuankun Liu

This author has not been identified. Look up 'Yuankun Liu' in Google

Xin Yu

This author has not been identified. Look up 'Xin Yu' in Google