Parasitic Reflection Eliminating for Planar Elements Based on Multi-Frequency Phase-Shifting in Phase Measuring Deflectometry

Siya Huang, Yuankun Liu, Xin Yu. Parasitic Reflection Eliminating for Planar Elements Based on Multi-Frequency Phase-Shifting in Phase Measuring Deflectometry. Sensors, 24(4):1239, February 2024. [doi]

Abstract

Abstract is missing.