Parasitic Reflection Eliminating for Planar Elements Based on Multi-Frequency Phase-Shifting in Phase Measuring Deflectometry

Siya Huang, Yuankun Liu, Xin Yu. Parasitic Reflection Eliminating for Planar Elements Based on Multi-Frequency Phase-Shifting in Phase Measuring Deflectometry. Sensors, 24(4):1239, February 2024. [doi]

@article{HuangLY24,
  title = {Parasitic Reflection Eliminating for Planar Elements Based on Multi-Frequency Phase-Shifting in Phase Measuring Deflectometry},
  author = {Siya Huang and Yuankun Liu and Xin Yu},
  year = {2024},
  month = {February},
  doi = {10.3390/s24041239},
  url = {https://doi.org/10.3390/s24041239},
  researchr = {https://researchr.org/publication/HuangLY24},
  cites = {0},
  citedby = {0},
  journal = {Sensors},
  volume = {24},
  number = {4},
  pages = {1239},
}