Yu Huang 0005, Nilanjan Mukherjee 0001, Wu-Tung Cheng, Greg Aldrich. A RTL Testability Analyzer Based on Logical Virtual Prototyping. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 121-124, IEEE, 2007. [doi]
Abstract is missing.