Jing Huang, Mariam Momenzadeh, Mehdi Baradaran Tahoori, Fabrizio Lombardi. Defect Characterization for Scaling of QCA Devices. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 30-38, IEEE Computer Society, 2004. [doi]
@inproceedings{HuangMTL04,
title = {Defect Characterization for Scaling of QCA Devices},
author = {Jing Huang and Mariam Momenzadeh and Mehdi Baradaran Tahoori and Fabrizio Lombardi},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/dft/2004/2241/00/22410030abs.htm},
researchr = {https://researchr.org/publication/HuangMTL04},
cites = {0},
citedby = {0},
pages = {30-38},
booktitle = {19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-2241-6},
}