Jiun-Lang Huang, Chee-Kian Ong, Kwang-Ting Cheng. A BIST Scheme for On-Chip ADC and DAC Testing. In 2000 Design, Automation and Test in Europe (DATE 2000), 27-30 March 2000, Paris, France. pages 216-220, IEEE Computer Society, 2000. [doi]
Abstract is missing.