LC-TSL: A low-cost triple-node-upset self-recovery latch design based on heterogeneous elements for 22 nm CMOS - researchr publication

researchr

You are not signed in
Sign in
Sign up

Zhengfeng Huang, Shangjie Pan, Hao Wang, Huaguo Liang, Tianming Ni. LC-TSL: A low-cost triple-node-upset self-recovery latch design based on heterogeneous elements for 22 nm CMOS. Microelectronics Journal, 117:105281, 2021. [doi]

Abstract is missing.

runs on WebDSL