Optimization of SCR for High-Speed Digital and RF Applications in 45-nm SOI CMOS Technology - researchr publication authors

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Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum. Optimization of SCR for High-Speed Digital and RF Applications in 45-nm SOI CMOS Technology. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-7, IEEE, 2023. [doi]

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