Optimization of SCR for High-Speed Digital and RF Applications in 45-nm SOI CMOS Technology

Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum. Optimization of SCR for High-Speed Digital and RF Applications in 45-nm SOI CMOS Technology. In IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023. pages 1-7, IEEE, 2023. [doi]

@inproceedings{HuangPZHR23,
  title = {Optimization of SCR for High-Speed Digital and RF Applications in 45-nm SOI CMOS Technology},
  author = {Shudong Huang and Srivatsan Parthasarathy and Yuanzhong Paul Zhou and Jean-Jacques Hajjar and Elyse Rosenbaum},
  year = {2023},
  doi = {10.1109/IRPS48203.2023.10118266},
  url = {https://doi.org/10.1109/IRPS48203.2023.10118266},
  researchr = {https://researchr.org/publication/HuangPZHR23},
  cites = {0},
  citedby = {0},
  pages = {1-7},
  booktitle = {IEEE International Reliability Physics Symposium, IRPS 2023, Monterey, CA, USA, March 26-30, 2023},
  publisher = {IEEE},
  isbn = {978-1-6654-5672-2},
}