Yu Huang, Janusz Rajski, Mark Kassab, Nilanjan Mukherjee 0001, Jeffrey Mayer. Effective Design of Layout-Friendly EDT Decompressor. In 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{HuangRK0M20, title = {Effective Design of Layout-Friendly EDT Decompressor}, author = {Yu Huang and Janusz Rajski and Mark Kassab and Nilanjan Mukherjee 0001 and Jeffrey Mayer}, year = {2020}, doi = {10.1109/VTS48691.2020.9107623}, url = {https://doi.org/10.1109/VTS48691.2020.9107623}, researchr = {https://researchr.org/publication/HuangRK0M20}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020}, publisher = {IEEE}, isbn = {978-1-7281-5359-9}, }