Yu Huang, Janusz Rajski, Mark Kassab, Nilanjan Mukherjee 0001, Jeffrey Mayer. Effective Design of Layout-Friendly EDT Decompressor. In 38th IEEE VLSI Test Symposium, VTS 2020, San Diego, CA, USA, April 5-8, 2020. pages 1-6, IEEE, 2020. [doi]
Abstract is missing.