Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs

Liang Huang, Tai Song, Tiezhen Jiang. Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs. Microelectronics Journal, 131:105641, 2023. [doi]

Authors

Liang Huang

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Tai Song

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Tiezhen Jiang

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