Liang Huang, Tai Song, Tiezhen Jiang. Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs. Microelectronics Journal, 131:105641, 2023. [doi]
@article{HuangSJ23,
title = {Linear regression combined KNN algorithm to identify latent defects for imbalance data of ICs},
author = {Liang Huang and Tai Song and Tiezhen Jiang},
year = {2023},
doi = {10.1016/j.mejo.2022.105641},
url = {https://doi.org/10.1016/j.mejo.2022.105641},
researchr = {https://researchr.org/publication/HuangSJ23},
cites = {0},
citedby = {0},
journal = {Microelectronics Journal},
volume = {131},
pages = {105641},
}