Rei-Fu Huang, Chin-Lung Su, Cheng-Wen Wu, Shen-Tien Lin, Kun-Lun Luo, Yeong-Jar Chang. Fail Pattern Identification for Memory Built-In Self-Repair. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 366-371, IEEE Computer Society, 2004. [doi]
Abstract is missing.