Nonintrusive On-Line Transition-Time Binning and Timing Failure Threat Detection for Die-to-Die Interconnects - researchr publication

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Shi-Yu Huang, Meng-Ting Tsai, Hua-Xuan Li, Zeng-Fu Zeng, Kun-Han Hans Tsai, Wu-Tung Cheng. Nonintrusive On-Line Transition-Time Binning and Timing Failure Threat Detection for Die-to-Die Interconnects. IEEE Trans. on CAD of Integrated Circuits and Systems, 34(12):2039-2048, 2015. [doi]

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