Yu Huang, Chien-Chung Tsai, Neelanjan Mukherjee, Omer Samman, Dan Devries, Wu-Tung Cheng, Sudhakar M. Reddy. On RTL scan design. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 728-737, IEEE Computer Society, 2001.
Abstract is missing.