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Yu Huang, Szczepan Urban, Wu-Tung Cheng, Manish Sharma, Fengju Niu, Junna Zhong, Wen-Lung Hsu. Reversible Scan Based Diagnostic Patterns. In International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2019, Hsinchu, Taiwan, April 22-25, 2019. pages 1-4, IEEE, 2019. [doi]

This author has not been identified. Look up 'Yu Huang' in GoogleThis author has not been identified. Look up 'Szczepan Urban' in GoogleThis author has not been identified. Look up 'Wu-Tung Cheng' in GoogleThis author has not been identified. Look up 'Manish Sharma' in GoogleThis author has not been identified. Look up 'Fengju Niu' in GoogleThis author has not been identified. Look up 'Junna Zhong' in GoogleThis author has not been identified. Look up 'Wen-Lung Hsu' in Google

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