Yu Huang, Szczepan Urban, Wu-Tung Cheng, Manish Sharma, Fengju Niu, Junna Zhong, Wen-Lung Hsu. Reversible Scan Based Diagnostic Patterns. In International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2019, Hsinchu, Taiwan, April 22-25, 2019. pages 1-4, IEEE, 2019. [doi]
Abstract is missing.