Zhengfeng Huang, Hao Wang, Dongxing Ma, Huaguo Liang, Yiming Ouyang, Aibin Yan. Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets. J. Electronic Testing, 39(3):289-301, June 2023. [doi]
@article{HuangWMLOY23,
title = {Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets},
author = {Zhengfeng Huang and Hao Wang and Dongxing Ma and Huaguo Liang and Yiming Ouyang and Aibin Yan},
year = {2023},
month = {June},
doi = {10.1007/s10836-023-06064-9},
url = {https://doi.org/10.1007/s10836-023-06064-9},
researchr = {https://researchr.org/publication/HuangWMLOY23},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {39},
number = {3},
pages = {289-301},
}