Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets

Zhengfeng Huang, Hao Wang, Dongxing Ma, Huaguo Liang, Yiming Ouyang, Aibin Yan. Low Overhead and High Stability Radiation-Hardened Latch for Double/Triple Node Upsets. J. Electronic Testing, 39(3):289-301, June 2023. [doi]

Abstract

Abstract is missing.