Ru Huang, Runsheng Wang, Jing Zhuge, Changze Liu, Tao Yu, LiangLiang Zhang, Xin Huang, Yujie Ai, Jinbin Zou, Yuchao Liu, Jiewen Fan, Huailin Liao, Yangyuan Wang. Characterization and analysis of gate-all-around Si nanowire transistors for extreme scaling. In Rakesh Patel, Tom Andre, Aurangzeb Khan, editors, 2011 IEEE Custom Integrated Circuits Conference, CICC 2011, San Jose, CA, USA, Sept. 19-21, 2011. pages 1-8, IEEE, 2011. [doi]
Abstract is missing.