Zhangcai Huang, Hong Yu, Atsushi Kurokawa, Yasuaki Inoue. Modeling the Overshooting Effect for CMOS Inverter in Nanometer Technologies. In Proceedings of the 12th Conference on Asia South Pacific Design Automation, ASP-DAC 2007, Yokohama, Japan, January 23-26, 2007. pages 565-570, IEEE, 2007. [doi]
Abstract is missing.