On the use of multi-tone for the measurement of noise power ratio distortion in RF circuits

Cheng Huang, Meng Zhang, Jianhui Wu, Shengli Lu, Longxing Shi. On the use of multi-tone for the measurement of noise power ratio distortion in RF circuits. In IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2008, Macao, China, November 30 2008 - December 3, 2008. pages 1596-1599, IEEE, 2008. [doi]

Authors

Cheng Huang

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Meng Zhang

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Jianhui Wu

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Shengli Lu

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Longxing Shi

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