On the use of multi-tone for the measurement of noise power ratio distortion in RF circuits

Cheng Huang, Meng Zhang, Jianhui Wu, Shengli Lu, Longxing Shi. On the use of multi-tone for the measurement of noise power ratio distortion in RF circuits. In IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2008, Macao, China, November 30 2008 - December 3, 2008. pages 1596-1599, IEEE, 2008. [doi]

@inproceedings{HuangZWLS08,
  title = {On the use of multi-tone for the measurement of noise power ratio distortion in RF circuits},
  author = {Cheng Huang and Meng Zhang and Jianhui Wu and Shengli Lu and Longxing Shi},
  year = {2008},
  doi = {10.1109/APCCAS.2008.4746340},
  url = {http://dx.doi.org/10.1109/APCCAS.2008.4746340},
  researchr = {https://researchr.org/publication/HuangZWLS08},
  cites = {0},
  citedby = {0},
  pages = {1596-1599},
  booktitle = {IEEE Asia Pacific Conference on Circuits and Systems, APCCAS 2008, Macao, China, November 30 2008 - December 3, 2008},
  publisher = {IEEE},
}