Junhua Huang, Hui-Ling Zhen, Naixing Wang, Hui Mao, Mingxuan Yuan, Yu Huang. Neural Fault Analysis for SAT-based ATPG. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 36-45, IEEE, 2022. [doi]
Abstract is missing.