Automatic Anti-Pattern Detection in Microservice Architectures Based on Distributed Tracing

Tim Hübener, Michel R. V. Chaudron, Yaping Luo, Pieter Vallen, Jonck van der Kogel, Tom Liefheid. Automatic Anti-Pattern Detection in Microservice Architectures Based on Distributed Tracing. In 44th IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, ICSE (SEIP) 2022, Pittsburgh, PA, USA, May 22-24, 2022. pages 75-76, IEEE, 2022. [doi]

Authors

Tim Hübener

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Michel R. V. Chaudron

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Yaping Luo

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Pieter Vallen

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Jonck van der Kogel

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Tom Liefheid

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