Tim Hübener, Michel R. V. Chaudron, Yaping Luo, Pieter Vallen, Jonck van der Kogel, Tom Liefheid. Automatic Anti-Pattern Detection in Microservice Architectures Based on Distributed Tracing. In 44th IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, ICSE (SEIP) 2022, Pittsburgh, PA, USA, May 22-24, 2022. pages 75-76, IEEE, 2022. [doi]
@inproceedings{HubenerCLVKL22,
title = {Automatic Anti-Pattern Detection in Microservice Architectures Based on Distributed Tracing},
author = {Tim Hübener and Michel R. V. Chaudron and Yaping Luo and Pieter Vallen and Jonck van der Kogel and Tom Liefheid},
year = {2022},
doi = {10.1109/ICSE-SEIP55303.2022.9794000},
url = {https://doi.org/10.1109/ICSE-SEIP55303.2022.9794000},
researchr = {https://researchr.org/publication/HubenerCLVKL22},
cites = {0},
citedby = {0},
pages = {75-76},
booktitle = {44th IEEE/ACM International Conference on Software Engineering: Software Engineering in Practice, ICSE (SEIP) 2022, Pittsburgh, PA, USA, May 22-24, 2022},
publisher = {IEEE},
isbn = {978-1-6654-9590-5},
}