Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty. Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 118-127, IEEE, 2022. [doi]
@inproceedings{HungCBC22,
title = {Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration},
author = {Shao-Chun Hung and Arjun Chaudhuri and Sanmitra Banerjee and Krishnendu Chakrabarty},
year = {2022},
doi = {10.1109/ITC50671.2022.00019},
url = {https://doi.org/10.1109/ITC50671.2022.00019},
researchr = {https://researchr.org/publication/HungCBC22},
cites = {0},
citedby = {0},
pages = {118-127},
booktitle = {IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022},
publisher = {IEEE},
isbn = {978-1-6654-6270-9},
}