Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty. Fault Diagnosis for Resistive Random-Access Memory and Monolithic Inter-tier Vias in Monolithic 3D Integration. In IEEE International Test Conference, ITC 2022, Anaheim, CA, USA, September 23-30, 2022. pages 118-127, IEEE, 2022. [doi]
Abstract is missing.