Scan Cell Segmentation Based on Reinforcement Learning for Power-Safe Testing of Monolithic 3D ICs - researchr publication authors

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Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty. Scan Cell Segmentation Based on Reinforcement Learning for Power-Safe Testing of Monolithic 3D ICs. In IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. pages 216-225, IEEE, 2023. [doi]

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