Shao-Chun Hung, Arjun Chaudhuri, Sanmitra Banerjee, Krishnendu Chakrabarty. Scan Cell Segmentation Based on Reinforcement Learning for Power-Safe Testing of Monolithic 3D ICs. In IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. pages 216-225, IEEE, 2023. [doi]
@inproceedings{HungCBC23-0,
title = {Scan Cell Segmentation Based on Reinforcement Learning for Power-Safe Testing of Monolithic 3D ICs},
author = {Shao-Chun Hung and Arjun Chaudhuri and Sanmitra Banerjee and Krishnendu Chakrabarty},
year = {2023},
doi = {10.1109/ITC51656.2023.00038},
url = {https://doi.org/10.1109/ITC51656.2023.00038},
researchr = {https://researchr.org/publication/HungCBC23-0},
cites = {0},
citedby = {0},
pages = {216-225},
booktitle = {IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023},
publisher = {IEEE},
isbn = {979-8-3503-4325-0},
}