Luong Dinh Hung, Hidetsugu Irie, Masahiro Goshima, Shuichi Sakai. Utilization of SECDED for soft error and variation-induced defect tolerance in caches. In Rudy Lauwereins, Jan Madsen, editors, 2007 Design, Automation and Test in Europe Conference and Exposition (DATE 2007), April 16-20, 2007, Nice, France. pages 1134-1139, ACM, 2007. [doi]
Abstract is missing.