Power Supply Noise-Aware At-Speed Delay Fault Testing of Monolithic 3-D ICs

Shao-Chun Hung, Yi-Chen Lu, Sung Kyu Lim, Krishnendu Chakrabarty. Power Supply Noise-Aware At-Speed Delay Fault Testing of Monolithic 3-D ICs. IEEE Trans. VLSI Syst., 29(11):1875-1888, 2021. [doi]

Abstract

Abstract is missing.