A Technology Path for Scaling Embedded FeRAM to 28nm with 2T1C Structure

Jae Hur, Yuan-Chun Luo, Zheng Wang, Wonbo Shim, Asif Islam Khan, Shimeng Yu. A Technology Path for Scaling Embedded FeRAM to 28nm with 2T1C Structure. In IEEE International Memory Workshop, IMW 2021, Dresden, Germany, May 16-19, 2021. pages 1-4, IEEE, 2021. [doi]

Abstract

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