Power-Constrained SOC Test Schedules through Utilization of Functional Buses

Fawnizu Azmadi Hussin, Tomokazu Yoneda, Alex Orailoglu, Hideo Fujiwara. Power-Constrained SOC Test Schedules through Utilization of Functional Buses. In 24th International Conference on Computer Design (ICCD 2006), 1-4 October 2006, San Jose, CA, USA. pages 230-236, IEEE, 2006. [doi]

Authors

Fawnizu Azmadi Hussin

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Tomokazu Yoneda

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Alex Orailoglu

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Hideo Fujiwara

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