Fawnizu Azmadi Hussin, Tomokazu Yoneda, Alex Orailoglu, Hideo Fujiwara. Power-Constrained SOC Test Schedules through Utilization of Functional Buses. In 24th International Conference on Computer Design (ICCD 2006), 1-4 October 2006, San Jose, CA, USA. pages 230-236, IEEE, 2006. [doi]
@inproceedings{HussinYOF06,
title = {Power-Constrained SOC Test Schedules through Utilization of Functional Buses},
author = {Fawnizu Azmadi Hussin and Tomokazu Yoneda and Alex Orailoglu and Hideo Fujiwara},
year = {2006},
url = {http://www.iccd-conference.org/proceedings/2006/paper_165.pdf},
tags = {testing},
researchr = {https://researchr.org/publication/HussinYOF06},
cites = {0},
citedby = {0},
pages = {230-236},
booktitle = {24th International Conference on Computer Design (ICCD 2006), 1-4 October 2006, San Jose, CA, USA},
publisher = {IEEE},
}