Fawnizu Azmadi Hussin, Tomokazu Yoneda, Alex Orailoglu, Hideo Fujiwara. Power-Constrained SOC Test Schedules through Utilization of Functional Buses. In 24th International Conference on Computer Design (ICCD 2006), 1-4 October 2006, San Jose, CA, USA. pages 230-236, IEEE, 2006. [doi]
Abstract is missing.