Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Seung H. Hwang, Gwan S. Choi. A Reliability Testing Environment for Off-the-Shelf Memory Subsystems. IEEE Design & Test of Computers, 17(3):116-124, 2000. [doi]
Abstract is missing.