Giusy Iaria, Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre. A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip. In 23rd IEEE Latin American Test Symposium, LATS 2022, Montevideo, Uruguay, September 5-8, 2022. pages 1-6, IEEE, 2022. [doi]
@inproceedings{IariaABRAGT22,
title = {A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip},
author = {Giusy Iaria and Francesco Angione and Paolo Bernardi and Matteo Sonza Reorda and Davide Appello and Giuseppe Garozzo and Vincenzo Tancorre},
year = {2022},
doi = {10.1109/LATS57337.2022.9936975},
url = {https://doi.org/10.1109/LATS57337.2022.9936975},
researchr = {https://researchr.org/publication/IariaABRAGT22},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {23rd IEEE Latin American Test Symposium, LATS 2022, Montevideo, Uruguay, September 5-8, 2022},
publisher = {IEEE},
isbn = {978-1-6654-5707-1},
}