Eishi Ibe, S. S. Chung, ShiJie Wen, Hironaru Yamaguchi, Yasuo Yahagi, Hideaki Kameyama, Shigehisa Yamamoto, Takashi Akioka. Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling. In Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006, DoubleTree Hotel, San Jose, California, USA, September 10-13, 2006. pages 437-444, IEEE, 2006. [doi]
@inproceedings{IbeCWYYKYA06,
title = {Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling},
author = {Eishi Ibe and S. S. Chung and ShiJie Wen and Hironaru Yamaguchi and Yasuo Yahagi and Hideaki Kameyama and Shigehisa Yamamoto and Takashi Akioka},
year = {2006},
doi = {10.1109/CICC.2006.321010},
url = {http://dx.doi.org/10.1109/CICC.2006.321010},
researchr = {https://researchr.org/publication/IbeCWYYKYA06},
cites = {0},
citedby = {0},
pages = {437-444},
booktitle = {Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006, DoubleTree Hotel, San Jose, California, USA, September 10-13, 2006},
publisher = {IEEE},
isbn = {1-4244-0075-9},
}