Eishi Ibe, S. S. Chung, ShiJie Wen, Hironaru Yamaguchi, Yasuo Yahagi, Hideaki Kameyama, Shigehisa Yamamoto, Takashi Akioka. Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling. In Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, CICC 2006, DoubleTree Hotel, San Jose, California, USA, September 10-13, 2006. pages 437-444, IEEE, 2006. [doi]
Abstract is missing.