Ahmed Ibrahim, Hans G. Kerkhoff. A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687. In 23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, July 3-5, 2017. pages 1-2, IEEE, 2017. [doi]
@inproceedings{IbrahimK17-0,
title = {A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687},
author = {Ahmed Ibrahim and Hans G. Kerkhoff},
year = {2017},
doi = {10.1109/IOLTS.2017.8046166},
url = {https://doi.org/10.1109/IOLTS.2017.8046166},
researchr = {https://researchr.org/publication/IbrahimK17-0},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, July 3-5, 2017},
publisher = {IEEE},
isbn = {978-1-5386-0352-9},
}