Hideyuki Ichihara, Kozo Kinoshita, Koji Isodono, Shigeki Nishikawa. Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs. In 16th International Conference on VLSI Design (VLSI Design 2003), 4-8 January 2003, New Delhi, India. pages 329-334, IEEE Computer Society, 2003. [doi]
Abstract is missing.