Hideyuki Ichihara, Kozo Kinoshita, Irith Pomeranz, Sudhakar M. Reddy. Test Transformation to Improve Compaction by Statistical Encoding. In 13th International Conference on VLSI Design (VLSI Design 2000), 4-7 January 2000, Calcutta, India. pages 294-299, IEEE Computer Society, 2000. [doi]
Abstract is missing.