Hideyuki Ichihara, Yuki Maeda, Tsuyoshi Iwagaki, Tomoo Inoue. State Encoding with Stochastic Numbers for Transient Fault Tolerant Linear Finite State Machines. In 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019, Noordwijk, Netherlands, October 2-4, 2019. pages 1-6, IEEE, 2019. [doi]
Abstract is missing.