Hideyuki Ichihara, Masakuni Ochi, Michihiro Shintani, Tomoo Inoue. A Test Decompression Scheme for Variable-Length Coding. In 13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan. pages 426-431, IEEE Computer Society, 2004. [doi]
@inproceedings{IchiharaOSI04,
title = {A Test Decompression Scheme for Variable-Length Coding},
author = {Hideyuki Ichihara and Masakuni Ochi and Michihiro Shintani and Tomoo Inoue},
year = {2004},
url = {http://csdl.computer.org/comp/proceedings/ats/2004/2235/00/22350426abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/IchiharaOSI04},
cites = {0},
citedby = {0},
pages = {426-431},
booktitle = {13th Asian Test Symposium (ATS 2004), 15-17 November 2004, Kenting, Taiwan},
publisher = {IEEE Computer Society},
isbn = {0-7695-2235-1},
}